1 a os semiconductor produc t reliabilit y repor t AOZ8000HI, rev 1 plastic encapsulated device alph a & omeg a semiconducto r , inc 495 mercury drive sunnyvale, ca 94085 u.s. tel: ( 408 ) 830-9742 www.aosmd.com mar 26, 2007
2 this aos product reliability report summarizes the qualification result for AOZ8000HI. review of the electrical test results confirm that AOZ8000HI pass aos quality and reliability requirements for product release. the continuous qualification te sting and reliability monitoring program ensure that all outgoing pr oducts will continue to meet ao s quality and reliability standards. table of contents: i. product description ii. package and die information iii. qualification test requirements iv. qualification tests result v. quality assurance information i. product description: the AOZ8000HI is a transient voltage suppressor array designed to protect high speed data lines from esd and lightning. the product comes in rohs compliant, sc70 package and is rated over a -40c to +85c ambient temperature range. . absolute maximum ratings parameter vp-vn 6v peak pulse current (ipp), tp=8/20us 5a peak power dissipation (8x20ms@ 25c) sot-23 50w storage temperature (t s ) -65c to +150c esd rating per iec61000-4-2, contact (1) 12kv esd rating per iec61000-4-2, air (2) 15kv esd rating per human body model (2) 15kv junction temperature (t j ) -40c to +125c notes: (1) iec-61000-4-2 discharge with c discharge =150pf, r discharge =330 ? (2) human body discharge per mil-std-883, method 3015 c discharge =100pf, r discharge =1.5k ? ii. package and die information: product id AOZ8000HI process umc 0.5um 5/18v 2p3m process package type sc70 die ue003a3 (size: 716 x 616 um) l/f material agcu die attach material ablebond 8006ns die bond wire au , 1mil mold material cel9220hf13 plating material pure tin iii. qualification tests requirments
3 ? 2 lots of AOZ8000HI up to 168 hrs of b/i for new product release. ? 2 additional lots of AOZ8000HI up to 168 hrs of b/i for new uh_epi process release. ? 2 lots of package qual testing (pct, 250 cycles tc) for sc70 for package release to manufacturing. iv. qualification tests result test item test condition sample size result comment pre- conditioning per jesd 22-a113 85 c 0 /85%rh, 3 cyc reflow@260 0 c 2 lot (82 /lot) pass l ot 1 ( wafer lot# f162t.51-20, marking: a02), 82 units, passed pre-conditioning. lot 2 (wafer lot# f162t.51-20, marking: a03), 82 units, passed pre-conditioning. htol (pkg qual burn-in ) per jesd 22-a108_b vdd=6v temp = 125 0 c 2 lot (80 /lot) pass l ot 1 ( wafer lot# f162t.51-20, marking: a02), 80 units, passed 500 hrs . lot 2 (wafer lot# f162t.51-20, marking: a03), 80 units, passed 500 hrs . htol (old ue003a process) per jesd 22-a108_b vdd=6v temp = 125 0 c 2 lot (80 /lot) pass lot 1 (wafer lot# f9an1.51-8, marking: abr11), 80 units, passed 1000 hrs . lot 2 (wafer lot# f9an1.51-10, marking: cbu11), 80 units, passed 500 hrs . htol (new uh_epi process) per jesd 22-a108_b vdd=6v temp = 125 0 c 2 lot (80 /lot) pass qual by extension using aoz8000c (same die in sot23 pkg.) lot 1 (wafer lot# fng88, marking: ac001), 80 units, passed 500 hrs . lot 2 (wafer lot# fayy3.02-3 marking: ab008), 80 units, passed 500 hrs . hast '130 +/- 2 0 c, 85%rh, 33.3 psi, at vcc min power dissapation 2 lot (60 /lot) pass l ot 1 ( wafer lot# f162t.51-20, marking: a02), 60 units, passed hast 100 hrs . lot 2 (wafer lot# f162t.51-20, marking: a03), 60 units, passed hast 100 hrs . temperature cycle '-65 0 c to +150 0 c, air to air (2cyc/hr) 2 lot (82 /lot) pass l ot 1 ( wafer lot# f162t.51-20, marking: a02), 82 units, passed tc 500 cycles. lot 2 (wafer lot# f162t.51-20, marking: a03), 82 units, passed tc 500 cycles. pressure pot 121c, 15+/-1 psig, rh= 100% 2 lot (82 /lot) pass l ot 1 ( wafer lot# f162t.51-20, marking: a02), 82 units, passed pct 96 hrs. lot 2 (wafer lot# f162t.51-20, marking: a03), 82 units, passed pct 96 hrs. esd rating per iec-61000-4-2, contact 3 units pass lot 1 ( wafer lot# fayy3.02-3, marking: ab008), 3 units passed 12kv esd rating per iec-61000-4-2, air 3 units pass lot 1 ( wafer lot# fayy3.02-3, marking: ab008), 3 units passed 15kv latch-up per jesd78a 3 units pass lot 1 (wafer lot# fayy3.02-3, marking: ab008), 3 units passed latch-up. the qualification test results confirm that AOZ8000HI pass aos quality and reliability requirements for product release.
4 v. quality assurance information acceptable quality level for outgoing inspection: 0.1% for electrical and visual. guaranteed outgoing defect rate: < 50 ppm quality sample plan: conform to mil-std -105d
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